Join us during the 68th edition of International Electron Devices Meeting!
IEEE International Electron Devices Meeting (IEDM) is the world's preeminent forum for reporting technological breakthroughs in the areas of semiconductor and electronic device technology, design, manufacturing, physics, and modeling.
IEDM is the flagship conference for nanometer-scale CMOS transistor technology, advanced memory, displays, sensors, MEMS devices, novel quantum and nano-scale devices and phenomenology, optoelectronics, devices for power and energy harvesting, high-speed devices, as well as process technology and device modeling and simulation.
CEA-Leti’s experts will present latest results and insights on DNA nanotechnologies, Memories, RFSOI Technologies and Quantum Computing at IEDM 2022.
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Simon Deleonibus will also receive the
IEEE Cledo Brunetti award 2022 for more than 35 years of contribution and leadership in nanoscale CMOS device and process technologies at Thomson Semiconductors (now STMicroelectronics) and CEA-Leti!
Be part of the discussion and find below CEA-Leti’s publications at IEDM 2022 !
| Dec 3rd – 3pm
Room Continental 4
| Elisa Vianello
| Tutorial - Resistive memories- based concepts for neuromorphic computing
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| Dec 5th – To be defined
Grand Ballroom B
| Maud Vinet
| Plenary session - Enabling full fault tolerant quantum computing with silicon based VLSI technologies
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| Dec 6th – 2:20pm
Room Continental 6
| L. Contamin et al.
| Technical session - Methodology for an efficient characterization flow of industrial grade Si-based qubit devices
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| Dec 6th – 2:45pm
Room Imperial A
| S. Barraud et al.
| Technical Session: High-Resolution DNA Binding Kinetics Measurements with Double Gate FD-SOI Transistors
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| Dec 6th – 4pm
Room Imperial A
| E. Hardy et al.
| Technical Session: Spike-based Beamforming using pMUT Arrays for Ultra-Low Power Gesture Recognition
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| Dec 7th – 12:25pm
Room Continental 5
| R. Alcala et al.
| Technical Session: The Role of Interface Dynamics on the Reliability performance of BEOL Integrated Ferroelectric HfO2 Capacitors
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| Dec 7th – 3:15pm
Room Continental 6
| F. Guyader et al.
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Technical Session:
3-Tier BSI CIS with 3D Sequential et Hybrid Bonding Enabling a1.4um pitch,106dB HDR Flicker Free Pixel
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| Dec 7th – 4:05pm
Grand Ballroom B
| M. Cassé et al.
| Technical Session: FDSOI for cryoCMOS electronics: device characterization towards compact model
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From Dec 12th, conferences will be available on demand.
December 4th, meet our experts during the Leti Devices Workshop and discover highly innovative technologies for More than Moore Solutions.
📍 Nikko Hotel, 222 Mason Street, San Francisco, CA 94 702