A new test vehicle for RRAM array characterization
| Auteurs | Nguyen C., Cagli C., Kadura L., Nodin J.-F., Bernasconi S., Reimbold G. |
| Year | 2017-0293 |
| Source-Title | IEEE International Conference on Microelectronic Test Structures |
| Affiliations | CEA-Leti, 17 avenue des Martyrs, Grenoble, France |
| Abstract | In this paper we present a new test vehicle designed for Resistive Random Access Memories (RRAM) arrays (from single bit to 1Mbits) characterization. The arrays structure, the decoders, and the selectors are explained as well as the electrical setup that drives the array decoders and performs the electrical characterization. Eventually, we discuss some electrical results concerning the switching voltage variability and show the performance of the test vehicle. © 2017 IEEE. |
| Author-Keywords | |
| Index-Keywords | Characterization, Decoding, Microelectronics, RRAM, Testing, Vehicles, Electrical characterization, Resistive random access memory (rram), Single-bit, Switching voltages, Test vehicle, Random access storage |
| ISSN | |
| Lien vers article | Link |