Operando hard X-ray photoelectron spectroscopy study of the Pt/Ru/PbZr0.52Ti0.48O3 interface
| Auteurs | Gueye I., Le Rhun G., Renault O., Cooper D., Ceolin D., Rueff J.-P., Barrett N. |
| Year | 2017-0352 |
| Source-Title | Applied Physics Letters |
| Affiliations | Univ. Grenoble Alpes, Grenoble, France, CEA, LETI, MINATEC Campus, Grenoble, France, Synchrotron-SOLEIL, BP 48, Saint-Aubin, Gif-sur-Yvette Cedex, France, SPEC, CEA, CNRS, Université Paris Saclay, Gif-sur-Yvette, France |
| Abstract | We have used hard X-ray photoelectron spectroscopy to probe the Pt/Ru/PbZr0.52Ti0.48O3 (PZT) interface in a Pt/Ru/PZT(220 nm)/Pt/TiO2/SiO2/Si stack. A customized sample-holder allows in-situ photoemission analysis while applying bias to the capacitor. Hard X-rays probe the buried interface between the top electrode and the ferroelectric PZT. The use of operando conditions reveals a polarization-dependent electronic response, most probably due to imperfect screening of the depolarizing field. There is evidence for an additional core level component related to the electrode-PZT interface. Zr oxide nanostructures at the surface of the sol-gel layer may form a ferroelectric dead layer at the interface, affecting device performance. © 2017 Author(s). |
| Author-Keywords | |
| Index-Keywords | Electrodes, Ferroelectricity, Photoelectrons, Photons, Sol-gels, Buried interface, Depolarizing fields, Device performance, Hard X-ray photoelectron spectroscopy, Oxide nanostructures, Photoemission analysis, Sample holders, Sol-gel layers, X ray photoelectron spectroscopy |
| ISSN | 36951 |
| Lien vers article | Link |