Inverse heat conduction problem in a phase change memory device
Auteurs | Battaglia J.-L., De I., Sousa V. |
Year | 2017-0111 |
Source-Title | Journal of Physics: Conference Series |
Affiliations | I2M Laboratory, University of Bordeaux, UMR CNRS 5295, 351 cours de la liberation, Talence Cedex, France, CEA-LETI, MINATEC, 17 rue des Martyrs, Grenoble Cedex 9, France |
Abstract | An invers heat conduction problem is solved considering the thermal investigation of a phase change memory device using the scanning thermal microscopy. The heat transfer model rests on system identification for the probe thermal impedance and on a finite element method for the device thermal impedance. Unknown parameters in the model are then identified using a nonlinear least square algorithm that minimizes the quadratic gap between the measured probe temperature and the simulated one. |
Author-Keywords | |
Index-Keywords | Finite element method, Heat sinks, Heat transfer, Inverse problems, Nanotechnology, Phase change memory, Probes, Heat conduction problems, Heat transfer model, Inverse heat conduction problem, Non-linear least squares, Scanning thermal microscopy, Thermal impedance, Heat conduction |
ISSN | 17426588 |
Lien vers article | Link |