Looking deep inside materials
| Nanocharacterisation Platform
The Nanocharacterization Platform is operated jointly by CEA-Liten, CEA-Leti, and IRIG. It has around 50 pieces of advanced characterization equipment. The platform serves as a center for expertise in sample preparation, scanning and transmission electron microscopy, X-ray imaging, molecular spectroscopy, and surface and ion beam analysis, supporting the CEA's research by providing information on the properties inside materials as well as at the surface and interfaces.
The platform can probe the structure of materials at resolutions from a
few hundred micrometers to the Angstrom using techniques like WAXS, SAXS, EBSD SEM, TEM, HR-TEM, FIB SEM (3D), and X-ray tomography. Spectroscopy (EELS, EDS) can be used to provide information on the chemical nature of a material or chemical and electronic environments. The platform can also perform
surface analyses (XPS, TOF-SIMS, Nano Auger), and use
molecular vibrational spectroscopy (Raman, FTIR). With such a wide range of techniques available, researchers can combine several sources of information to create
multi-scale analyses and make more reliable interpretations by correlating data from different tools.
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