X Ray Attacks for the countermeasures development for the security of microelectronics devices 

With the future of digital security in mind, scientists from LETI-ITSEF explored the use of synchrotron-based nanobeams as a new tool to corrupt electronic circuits. They were able to modify the behavior of single memory cells and single transistors at 45nm technology node. This is a demonstration of a new innovative technique to test the vulnerability of secure electronic circuits.

Nanofocused X-rays can be focused down to target a single transistor in the combinatory logic, which means that individual functions or part of a device can be modified.

The project aims at developing this new type of attacks, on more advanced technologies and with less demanding attack equipment such as laboratory X-rays generator. 

The modelization will provide a better understanding of the involved physical mechanisms during the X-rays exposure. In this project, tests and simulations will enable the development of new protections mechanisms.