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A new test vehicle for RRAM array characterization

Published on 29 March 2018
A new test vehicle for RRAM array characterization
Description
 
Date 
Authors
Nguyen C., Cagli C., Kadura L., Nodin J.-F., Bernasconi S., Reimbold G.
Year2017-0293
Source-TitleIEEE International Conference on Microelectronic Test Structures
Affiliations
CEA-Leti, 17 avenue des Martyrs, Grenoble, France
Abstract
In this paper we present a new test vehicle designed for Resistive Random Access Memories (RRAM) arrays (from single bit to 1Mbits) characterization. The arrays structure, the decoders, and the selectors are explained as well as the electrical setup that drives the array decoders and performs the electrical characterization. Eventually, we discuss some electrical results concerning the switching voltage variability and show the performance of the test vehicle. © 2017 IEEE.
Author-Keywords
 
Index-Keywords
Characterization, Decoding, Microelectronics, RRAM, Testing, Vehicles, Electrical characterization, Resistive random access memory (rram), Single-bit, Switching voltages, Test vehicle, Random access storage
ISSN 
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