Adsorbate Screening of Surface Charge of Microscopic Ferroelectric Domains in Sol-Gel PbZr0.2Ti0.8O3 Thin Films
| Description | |
| Date | |
| Authors | Copie O., Chevalier N., Le Rhun G., Rountree C.L., Martinotti D., Gonzalez S., Mathieu C., Renault O., Barrett N. |
| Year | 2017-0418 |
| Source-Title | ACS Applied Materials and Interfaces |
| Affiliations | SPEC, CEA, CNRS, Université Paris-Saclay, CEA Saclay, Gif-sur-Yvette-Cedex, France, Univ. Grenoble Alpes, Grenoble, France, CEA, LETI, MINATEC Campus, Grenoble, France, Institut Jean Lamour, UMR 7198 CNRS, Université de Lorraine, Vandœuvre-lès-Nancy, France |
| Abstract | We present a study of adsorbate screening of surface charge in microscopic ferroelectric domains in a sol-gel grown PbZr0.2Ti0.8O3 thin film. Low-energy and photoemission electron microscopies were employed to characterize the temperature dependence of surface charge and polarization of ferroelectric domains written by atomic force microscopy. We study the role of charged adsorbates in screening of polarization-bound charges. We demonstrate that full-field electron microscopy is suitable for the determination of ferroelectric system properties such as the Curie temperature. © 2017 American Chemical Society. |
| Author-Keywords | AFM, LEEM, PEEM, PFM, polarization, PZT, screening, surface |
| Index-Keywords | Adsorbates, Atomic force microscopy, Electron microscopes, Electron microscopy, Ferroelectric films, Polarization, Screening, Sol-gel process, Sol-gels, Surface charge, Surfaces, Temperature distribution, Thin films, Bound charge, Ferroelectric domains, Ferroelectric system, Field electron microscopy, LEEM, PEEM, Photoemission electron microscopy, Temperature dependence, Ferroelectricity |
| ISSN | 19448244 |
| Link | Link |