PsD-DRT-24-0033
| Research Field | Advanced nano characterization
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| Domaine-S | Radiation-matter interactions
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| Theme | Technological challenges
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| Theme-S | Condensed matter physics, chemistry & nanosciences
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| Domaine | Advanced nano characterization
Technological challenges
Radiation-matter interactions
Condensed matter physics, chemistry & nanosciences
DRT
DPFT
SMCP
LPMS
Grenoble
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| Title | Development and application of TERS/TEPL technique for advanced characterization of materials
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| Abstract | TERS/TEPL (Tip-Enhanced Raman Spectroscopy and Tip-Enhanced Photoluminescence) are powerful analytical techniques developed for nanoscale material characterization. The recent acquisition of a unique and versatile TERS/TEPL equipment at PFNC (Nano-characterization Platform) of CEA LETI opens up new horizons for materials characterization. This tool combines Raman spectroscopy, photoluminescence, and scanning probe microscopy. It features multi-wavelength capabilities (from UV to NIR), allowing a wide range of applications and providing unparalleled insights into the composition, structure, and mechanical/electrical properties of materials at nanoscale resolution. The current project aims to develop and accelerate the implementation of the TERS/TEPL techniques at PFNC to fully exploit its potential in diverse ongoing projects at CEA-Grenoble (LETI/LITEN/IRIG) and with its partners.
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| Location | Département des Plateformes Technologiques (LETI)
Service de Métrologie et de Caractérisation Physique
Laboratoire Propriétés des Matériaux et Structures
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| Pcontact | LE
Van-Hoan
CEA
DRT/DPFT//LPMS
CEA - Grenoble
17 avenue des martyrs, 38054 Grenoble
+33 4 38 78 95 88
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| Start date | 1/1/2024 |
| Contact person | van-hoan.le@cea.fr
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